The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 14, 2015
Filed:
Feb. 01, 2013
Applicant:
Qualcomm Incorporated, San Diego, CA (US);
Inventors:
Hongmei Liao, San Diego, CA (US);
Karim Arabi, San Diego, CA (US);
Assignee:
QUALCOMM Incorporated, San Diego, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01); G01R 31/3185 (2006.01); H01L 21/66 (2006.01); G06F 11/267 (2006.01);
U.S. Cl.
CPC ...
G06F 17/5081 (2013.01); G01R 31/318558 (2013.01); H01L 22/34 (2013.01); G06F 11/267 (2013.01); H01L 2924/0002 (2013.01);
Abstract
A method includes identifying at least a portion of a design of a semiconductor device to be fabricated as a yield sensitive circuit. The method also includes, in response to identifying the yield sensitive circuit, forming a scan chain. Forming the scan chain includes inserting the yield sensitive circuit between a pair of flip flops and connecting the yield sensitive circuit to the pair of flip flops.