The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 14, 2015

Filed:

Mar. 15, 2013
Applicant:

Sony Corporation, Tokyo, JP;

Inventors:

Xun Xu, Palo Alto, CA (US);

Akira Nakamura, San Jose, CA (US);

Shengyang Dai, San Jose, CA (US);

Su Wang, San Jose, CA (US);

Assignee:

Sony Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 17/3053 (2013.01); G06K 9/00147 (2013.01);
Abstract

Content-based retrieval of digital pathology images (DPI) is a fundamental component in an intelligent DPI processing and management system. The fundamental procedure of the retrieval is evaluating the similarity between the query image and every image in the database with some distance function, and sorting of the latter based on their distances to the query. A novel approach to optimally combine a set of existing distance functions into a stronger distance that is suitable for retrieving DPI in a way respecting human perception of image similarity is described herein.


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