The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 14, 2015
Filed:
Aug. 30, 2014
Bertec Corporation, Columbus, OH (US);
Necip Berme, Worthington, OH (US);
Scott Zerkle Barnes, Thornville, OH (US);
Lewis Michael Nashner, Watertown, MA (US);
Bertec Corporation, Columbus, OH (US);
Abstract
A force measurement system includes a force measurement assembly configured to receive a subject thereon, at least one visual display device having an output screen, and one or more data processing devices configured to generate a screen image comprising a plurality of substantially concentric bands on the output screen of the at least one visual display device that is configured to create a visual stimuli for the subject disposed on the force measurement assembly. A plurality of methods for testing a subject is also disclosed herein. The methods for testing a subject utilize a force measurement assembly and/or augmented reality glasses. A measurement system including a motion detection system, an object position detection system, and/or an eye movement tracking device is additionally disclosed herein.