The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 14, 2015
Filed:
Dec. 16, 2008
Applicants:
Masahiro Takizawa, Tokyo, JP;
Hiroyuki Itagaki, Tokyo, JP;
Inventors:
Masahiro Takizawa, Tokyo, JP;
Hiroyuki Itagaki, Tokyo, JP;
Assignee:
HITACHI MEDICAL CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G01R 33/561 (2006.01); A61B 5/055 (2006.01); G01R 33/48 (2006.01); G01R 33/54 (2006.01);
U.S. Cl.
CPC ...
G01R 33/5615 (2013.01); A61B 5/055 (2013.01); G01R 33/4818 (2013.01); G01R 33/543 (2013.01); G01R 33/546 (2013.01); G01R 33/5616 (2013.01);
Abstract
An image in which an area of interest on an image is optimally susceptibility-emphasized is obtained in susceptibility-emphasized imaging. A measuring order of plural echo signals is controlled in accordance with the size of a desired area of interest of an examinee. Preferably, a target frequency in a K space is determined in accordance with the size of the area of interest, and the measuring order of plural echo signals is controlled so that an echo signal corresponding to the target frequency is measured at a target echo signal or in the neighborhood of the target echo time.