On-chip ir drop detectors for functional and test mode scenarios, circuits, processes and systems

Abstract

An integrated circuit includes a functional circuit () having a power grid () with a set of power grid points () for monitoring; and an electronic monitoring circuit () that has a variably operable reference circuit () responsive to an input register () and having an output, comparison circuitry () having plural outputs and having a first input coupled to the output of said variably operable reference circuit () and a set of second inputs each second input coupled to a respective one of said power grid points (); and an output register () having at least two register bit cells () respectively fed by the plural outputs of said comparison circuitry (). Other integrated circuits, and processes of testing and of manufacturing are also disclosed.