The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 14, 2015
Filed:
Oct. 10, 2011
Amit Vijay Nahar, Allen, TX (US);
Ben Chia-ming Chang, Allen, TX (US);
Nelson Kei Leung, Plano, TX (US);
Francis Eongsoo Lim, Plano, TX (US);
Amit Vijay Nahar, Allen, TX (US);
Ben Chia-Ming Chang, Allen, TX (US);
Nelson Kei Leung, Plano, TX (US);
Francis Eongsoo Lim, Plano, TX (US);
TEXAS INSTRUMENTS INCORPORATED, Dallas, TX (US);
Abstract
The problem of high test cost of manufactured goods can be partially solved by lowering the percentage of the goods to be tested methodically while keeping the total defective portion of the goods expressed in DPPM below a preset target value. The method includes identifying a first test that is capable of screening out enough parts that would fail a second test so that the portion of the parts to be tested second test can be reduced. The number of parts screened out by the first test determines if the reduced testing scheme would violate the preset DPPM target value.