The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 14, 2015
Filed:
Jan. 20, 2011
Applicants:
Andrea Deutinger, Pastetten, DE;
Gerd Hechtfischer, Vaterstetten, DE;
Christian Evers, Kirchheim, DE;
Inventors:
Andrea Deutinger, Pastetten, DE;
Gerd Hechtfischer, Vaterstetten, DE;
Christian Evers, Kirchheim, DE;
Assignee:
Rohde & Schwarz GmbH & Co. KG, Munich, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 1/067 (2006.01); G01R 21/04 (2006.01);
U.S. Cl.
CPC ...
G01R 1/06772 (2013.01); G01R 21/04 (2013.01); G01R 1/06738 (2013.01); G01R 1/06766 (2013.01);
Abstract
A measuring device used for registering a test signal originating from a circuit structure applied to a wafer. The measuring device provides at least one test probe and at least one test transformer. The at least one test transformer is connected to the at least one test probe in an electrically conductive manner. In this context, the test transformer is arranged on the test probe.