The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 14, 2015

Filed:

Sep. 27, 2012
Applicants:

Sysmex Corporation, Kobe-shi, Hyogo, JP;

Arkray, Inc., Kyoto-shi, Kyoto, JP;

Inventors:

Takayoshi Izumi, Hyogo, JP;

Keisuke Tsutsumida, Hyogo, JP;

Toru Mizumoto, Hyogo, JP;

Shinya Nakajima, Kyoto, JP;

Koji Fujimoto, Kyoto, JP;

Assignees:

SYSMEX CORPORATION, Hyogo, JP;

ARKRAY, INC., Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 35/02 (2006.01); G01N 33/493 (2006.01); G01N 35/04 (2006.01); G01N 35/00 (2006.01);
U.S. Cl.
CPC ...
G01N 35/0092 (2013.01); G01N 33/493 (2013.01); G01N 2035/0415 (2013.01);
Abstract

A sample analyzer which transports and analyzes samples, includes: a first measurement apparatus which measures samples; a second measurement apparatus which is arranged downstream, in a transport direction, from the first measurement apparatus, and which measures samples; a transporting apparatus which transports samples to a first supply position for supplying a sample to the first measurement apparatus, and to a second supply position for supplying a sample to the second measurement apparatus; and a controller which controls transportation of a sample present at the first supply position, in accordance with a processing status of a sample present at the second supply position.


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