The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 14, 2015

Filed:

Jan. 27, 2012
Applicants:

Christian Simard, Quebec City, CA;

Denys Laquerre, St-Augustine de-Desmaures, CA;

Inventors:

Christian Simard, Quebec City, CA;

Denys Laquerre, St-Augustine de-Desmaures, CA;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/26 (2006.01); G01N 29/34 (2006.01);
U.S. Cl.
CPC ...
G01N 29/262 (2013.01); G01N 29/343 (2013.01);
Abstract

Disclosed is a method and a phased array inspection device enabling calibration of the device with an optimized pulse rate, the pulse rate is derived based on the true adaptive value of the impedance of the specific phased array probe circuit or the pulser circuit and the circuit energy consumption limitations. The energy consumption limitations include the total energy made available by the power supply to the pulser and probe circuit and the pulser energy consumption with limitation due to pulser circuit's physical limit such as thermal limitation.


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