The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 14, 2015
Filed:
Mar. 29, 2013
Jason Habermehl, Quebec, CA;
Jinchi Zhang, Quebec, CA;
Jason Habermehl, Quebec, CA;
Jinchi Zhang, Quebec, CA;
OLYMPUS SCIENTIFIC SOLUTIONS AMERICAS INC., Waltham, MA (US);
Abstract
A method of using a 1.5D array ultrasonic probe as a component of an inspection system intended for different diameter cylindrical parts without mechanical adjustments of the probe is presented. In particular, the method is presented as a way to improve the near surface resolution over an extended range of cylindrical parts diameter and inspection depths/tubes wall thickness with respect to usual 1D arrays of fixed curvature along the elevation axis. The method relies on a customizable concentric firing pattern of the acoustic pulses with respect to the cylindrical part surface, and on adjustment of the aperture size of the said array. The intended effect is to sharpen and minimize the extent of the front wall echo and to optimize the response from an eventual flaw in the inspected range.