The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9080932 B1

PDF
Full Text
Expired
Date of Patent:
Jul. 14, 2015

Filed:

May. 13, 2013
Applicant:

Apple Inc., Cupertino, CA (US);

Inventors:

Dhaval N. Shah, Fremont, CA (US);

Shayan Malek, San Jose, CA (US);

Vivek Katiyar, Los Gatos, CA (US);

Assignee:

Apple Inc., Cupertino, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 3/30 (2006.01); G01M 99/00 (2011.01); G01N 3/303 (2006.01); G01N 33/00 (2006.01);
U.S. Cl.
CPC ...
G01N 3/30 (2013.01); G01M 99/00 (2013.01); G01N 3/303 (2013.01); G01N 2033/0078 (2013.01);
Abstract

An electronic device may contain electrical components mounted on one or more substrates such as printed circuit boards. During a drop event, the printed circuit boards and components may be subjected to stresses. Strain gauges may be formed from metal traces embedded within dielectric layers in the printed circuit boards. The strain gauges may be used to make stress measurements at various locations on the boards. Stress data may be collected in response to data from an accelerometer indicating that the device has been dropped. Stress data collection may be halted in response to determining that the device has struck an external surface. Impact may be detected using accelerometer data, strain gauge output, or other sensor data. Stress data may be analyzed by the electronic device or external equipment.


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