The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 14, 2015
Filed:
Apr. 17, 2009
Heinz Lippuner, Rebstein, CH;
Knut Siercks, Moerschwil, CH;
Heinz Lippuner, Rebstein, CH;
Knut Siercks, Moerschwil, CH;
LEICA GEOSYSTEMS AG, Heerbrugg, CH;
Abstract
A measuring method for determining a measurement position of a probe elementcan include using a coordinate measuring machinehaving a base and members that can be moved relative to the base and relative to each other, wherein one of the members, as the probe member TG, comprises a probe element, so that the probe elementcan move freely within a prescribed volume of space, wherein the measurement position is captured by the probe element, a measurement variable set is taken by measuring measurement variables linked to a measurement position of the members, wherein the measurement position is determined by a relative location of the members to each other and of at least one of the members to the base, and the measurement position is determined relative to the base.