The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 14, 2015
Filed:
Sep. 04, 2013
Nidek Co., Ltd., Gamagori, Aichi, JP;
Takayasu Yamamoto, Toyokawa, JP;
NIDEK CO., LTD., Aichi, JP;
Abstract
An eyeglass frame shape measuring apparatus includes: a frame holding unit holding an eyeglass frame; a tracing stylus inserted into a bevel groove of the rim; a moving unit moving the tracing stylus; and a controller controls the moving unit and obtains measurement data of a shape of the rim. The controller controls the moving unit based on a first measurement operation to perform a first measurement. The controller decides whether the first measurement is performed in a first state in which the tracing stylus is inserted into the bevel groove at the time of starting the first measurement or a second state in which the tracing stylus is not inserted into the bevel groove at the time of starting the first measurement. If the controller decides that it is the second state, the controller performs a second measurement based on a second measurement operation.