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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9080844 B1

PDFFull Text
Date of Patent:
Jul. 14, 2015

Filed:

May. 02, 2011

Linking of microscopes for analysis of objects comprising tool marks

Applicants:

Alain Beauchamp, Montreal, CA;

Danny Roberge, St-Bruno, CA;

Benoit Perron, Boucherville, CA;

Inventors:

Alain Beauchamp, Montreal, CA;

Danny Roberge, St-Bruno, CA;

Benoit Perron, Boucherville, CA;

Assignee:

ULTRA ELECTRONICS FORENSIC TECHNOLOGY INC., Cote Saint-Luc, CA;

Attorney:

Norton Rose Fulbright Canada LLP

Primary Examiner:

Ke Xiao

Assistant Examiner:

Raffi Isanians

Int. Cl.
CPC ...
G06K 9/60 (2006.01); F42B 35/00 (2006.01); G02B 21/18 (2006.01); G02B 21/36 (2006.01); G06T 7/00 (2006.01); G01N 15/14 (2006.01); G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
F42B 35/00 (2013.01); G02B 21/18 (2013.01); G02B 21/365 (2013.01); G06T 7/0028 (2013.01); G01N 15/1475 (2013.01); G02B 21/0016 (2013.01); G06T 2207/10012 (2013.01); G06T 2207/10021 (2013.01); G06T 2207/10028 (2013.01); G06T 2207/30136 (2013.01);
Abstract

There is provided a method for analyzing at least one object under a first microscope and a second microscope concurrently by linking the two microscopes together. Movement of one microscope will result in movement of the other. This is done by computing a transformation to link a first coordinate system and a second coordinate system and generating guidance data when one of the two microscopes is displaced, the guidance data corresponding to a set of operations to be applied to the other microscope to follow movement of the microscope that is displaced.

Find Patent Forward Citations

Beauchamp, Alain. (2015). Linking of microscopes for analysis of objects comprising tool marks (U.S. Patent No. 9080844). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9080844

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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