The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 14, 2015
Filed:
May. 02, 2011
Applicants:
Alain Beauchamp, Montreal, CA;
Danny Roberge, St-Bruno, CA;
Benoit Perron, Boucherville, CA;
Inventors:
Assignee:
ULTRA ELECTRONICS FORENSIC TECHNOLOGY INC., Cote Saint-Luc, CA;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/60 (2006.01); F42B 35/00 (2006.01); G02B 21/18 (2006.01); G02B 21/36 (2006.01); G06T 7/00 (2006.01); G01N 15/14 (2006.01); G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
F42B 35/00 (2013.01); G02B 21/18 (2013.01); G02B 21/365 (2013.01); G06T 7/0028 (2013.01); G01N 15/1475 (2013.01); G02B 21/0016 (2013.01); G06T 2207/10012 (2013.01); G06T 2207/10021 (2013.01); G06T 2207/10028 (2013.01); G06T 2207/30136 (2013.01);
Abstract
There is provided a method for analyzing at least one object under a first microscope and a second microscope concurrently by linking the two microscopes together. Movement of one microscope will result in movement of the other. This is done by computing a transformation to link a first coordinate system and a second coordinate system and generating guidance data when one of the two microscopes is displaced, the guidance data corresponding to a set of operations to be applied to the other microscope to follow movement of the microscope that is displaced.