The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 14, 2015

Filed:

Oct. 04, 2013
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Seung-woo Shin, Yongin-si, KR;

Jeong-hwan Kim, Seoul, KR;

Do-kwan Oh, Suwon-si, KR;

Dong-jae Lee, Hwaseong-si, KR;

Sang-chul Lee, Suwon-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H05G 1/02 (2006.01); A61B 6/00 (2006.01);
U.S. Cl.
CPC ...
A61B 6/4452 (2013.01); A61B 6/4435 (2013.01); A61B 6/5241 (2013.01);
Abstract

An X-ray apparatus includes: a source for emitting X-rays to an object; a detector for detecting the X-rays penetrating the object; an arm for connecting the source to the detector and moving the detector up and down according to a rotation of the source; and a controller for controlling an imaging of the object by driving the arm.


Find Patent Forward Citations

Shin, Seung-woo. (2015). X-ray apparatus and method of obtaining x-ray image (U.S. Patent No. 9078620). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9078620

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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