The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 14, 2015
Filed:
Dec. 02, 2011
Terry A. Fuller, Rydal, PA (US);
Yongping Wang, Philadelphia, PA (US);
Anthony Bellezza, Cherry Hill, NJ (US);
William Lai, Philadelphia, PA (US);
Terry A. Fuller, Rydal, PA (US);
Yongping Wang, Philadelphia, PA (US);
Anthony Bellezza, Cherry Hill, NJ (US);
William Lai, Philadelphia, PA (US);
Third Eye Diagnostics, Inc., Bethlehem, PA (US);
Abstract
Provided are systems and methods for noninvasively assessing intracranial pressure by controllably applanating at least a portion of a subject's ocular globe so as to collapse an intraocular blood vessel and correlating the collapse pressure to intracranial pressure. Also provided are ophthalmic components useful in ophthalmic imaging applications, as well as methods of assessing intracranial pressure that are based, at least in part, on the degree of papilledema, if any, present in the subject.