The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 14, 2015

Filed:

May. 31, 2012
Applicants:

Kunio Suzuki, Nagoya, JP;

Noriji Kawai, Gamagori, JP;

Masakazu Endo, Okazaki, JP;

Inventors:

Kunio Suzuki, Nagoya, JP;

Noriji Kawai, Gamagori, JP;

Masakazu Endo, Okazaki, JP;

Assignee:

NIDEK CO., LTD., Aichi, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 3/117 (2006.01); A61B 3/107 (2006.01); A61B 3/10 (2006.01); A61B 3/103 (2006.01);
U.S. Cl.
CPC ...
A61B 3/117 (2013.01); A61B 3/1005 (2013.01); A61B 3/107 (2013.01); A61B 3/103 (2013.01);
Abstract

An anterior segment measuring apparatus includes: a light projecting optical system for forming a light section on an anterior segment; a light receiving optical system for obtaining a cross-sectional image of the anterior segment by scattering of the light section at the anterior segment; a displacement detection unit for detecting displacement in a direction orthogonal to the light section between the position where the actual cross-sectional image is acquired and the position of the expected cross-sectional image; and a controller for forming the cross-sectional image of the anterior segment, processing the cross-sectional image to measure the anterior segment, and correcting a measurement result for the anterior segment based on a detection result by the displacement detection unit.


Find Patent Forward Citations

Loading…