The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 07, 2015

Filed:

May. 01, 2014
Applicant:

Marvell International Ltd., Hamilton, BM;

Inventors:

Mats Oberg, San Jose, CA (US);

Gregory H. Burd, San Jose, CA (US);

Hongxin Song, Sunnyvale, CA (US);

Michael B. Madden, Mountain View, CA (US);

Qiyue Zou, San Jose, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 27/06 (2006.01); H04L 1/00 (2006.01);
U.S. Cl.
CPC ...
H04L 1/0054 (2013.01);
Abstract

Systems and methods for detecting cycle slip are provided. In some embodiments, a waveform that represents data samples is received. The waveform may include a predetermined preamble and a predetermined postamble. A first value representing a phase of the predetermined preamble of the waveform may be computed. A second value representing a phase of the predetermined postamble of the waveform may be computed. A detection is made as to whether cycle slip occurred during sampling the received waveform based on a comparison of the first value with the second value.


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