The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 07, 2015

Filed:

Mar. 18, 2013
Applicant:

Power Forest Technology Corporation, Hsinchu, TW;

Inventors:

Po-Jen Ke, Taoyuan County, TW;

Yun-Chi Chiang, Hsinchu County, TW;

Tso-Min Chen, Hsinchu, TW;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H02M 3/335 (2006.01); H02H 7/12 (2006.01); H02M 1/32 (2007.01); H02H 7/122 (2006.01); H02M 1/00 (2007.01);
U.S. Cl.
CPC ...
H02H 7/1213 (2013.01); H02M 3/33507 (2013.01); H02H 7/122 (2013.01); H02M 1/32 (2013.01); H02M 3/33523 (2013.01); H02M 2001/0022 (2013.01); H02M 2001/327 (2013.01);
Abstract

A flyback-based power conversion apparatus and a power conversion method thereof are provided. By switching first and second detection switches disposed in a control chip and coupled to a multi-function pin of the control chip at different timings, the present invention applies a collocation of a voltage-current detection auxiliary circuit and a current detection circuit at a certain timing to execute a detection of the AC input voltage received by a flyback power conversion circuit, and the present invention applies a collocation of the auxiliary voltage-current detection circuit, an over temperature protection unit and an over voltage protection unit at another timing to execute detections of an over temperature protection and an over voltage protection. As the result, a single multi-function detection pin of the control pin is corresponding to a plurality of related function detections, so as to reduce the production cost of manufacturing the control chip.


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