The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 07, 2015
Filed:
Jan. 07, 2013
Apple Inc., Cupertino, CA (US);
Ye Yin, Sunnyvale, CA (US);
Gabriel Marcu, San Jose, CA (US);
Julia C. Davoud, San Francisco, CA (US);
Apple Inc., Cupertino, CA (US);
Instrument Systems Optische Messtechnik GmbH, Munich, DE;
Abstract
An optical test equipment/method for display testing that features parallel testing/sensing configuration that covers spectrum and colorimetric quantities with spatial resolution is disclosed. In one embodiment, a spectra-camera, which is a hybrid system consisting of both a single-point spectrometer and an imaging colorimeter, can be configured for concurrent display artifact and parametric testing. An aperture mirror with a hole in the middle splits an image of a test display into two parts. One part of the image passes through the hole and is directed to the spectrometer for display parametric testing. The rest of the image is reflected off the aperture mirror for concurrent display artifact testing with the colorimeter. In another embodiment, a beam splitter can be used instead of an aperture mirror. In yet another embodiment, the single-point high accuracy spectrometer can be used to calibrate the low accuracy imaging colorimeter.