The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 07, 2015

Filed:

Dec. 08, 2013
Applicants:

Fu Tai Hua Industry (Shenzhen) Co., Ltd., Shenzhen, CN;

Hon Hai Precision Industry Co., Ltd., New Taipei, TW;

Inventors:

Jian-Jian Zhu, Shenzhen, CN;

Yu-Kai Xiong, Shenzhen, CN;

Xin Lu, Shenzhen, CN;

Hui-Feng Liu, Shenzhen, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/46 (2006.01); G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
G06K 9/4642 (2013.01); G06K 9/6212 (2013.01);
Abstract

A computerized method determines a similarity between a first image and a second image. The first image is converted into a first grayscale image, and the second image is converted into a second grayscale image. A first feature vector of the first grayscale image and a second feature vector of the second grayscale image are extracted. A similarity value is calculated indicating the similarity between the first image and the second image according to the first feature vector and the second feature vector. If the similarity value is greater than or equal to the predetermined threshold, the first image is similar to the second image and a determination result is outputted denoting the first image is similar to the second image.


Find Patent Forward Citations

Zhu, Jian-Jian. (2015). Image processing device and method for determining a similarity between two images (U.S. Patent No. 9076066). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9076066

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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