The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 07, 2015

Filed:

Dec. 05, 2012
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Ka-Ming Leung, Marsfield, AU;

Simon John Liddington, Drummoyne, AU;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/32 (2006.01); G06T 7/00 (2006.01);
U.S. Cl.
CPC ...
G06K 9/3241 (2013.01); G06K 9/3216 (2013.01); G06K 2009/3225 (2013.01); G06T 7/0044 (2013.01); G06T 7/0071 (2013.01); G06T 7/0075 (2013.01); G06T 2207/10016 (2013.01); G06T 2207/10021 (2013.01); G06T 2207/30208 (2013.01);
Abstract

A method of selecting a first image from a plurality of images for constructing a coordinate system of an augmented reality system. A first image feature in the first image corresponding to the feature of the marker is determined. A second image feature in a second image is determined based on a second pose of a camera, said second image feature having a visual match to the first image feature. A reconstructed position of the feature of the marker in a three-dimensional (3D) space is determined based on positions of the first and second image features, the first and the second camera pose. A reconstruction error is determined based on the reconstructed position of the feature of the marker and a pre-determined position of the marker.


Find Patent Forward Citations

Loading…