The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 07, 2015
Filed:
Oct. 20, 2011
Applicants:
Leo L. Chan, North Andover, MA (US);
Jean Qiu, North Andover, MA (US);
Peter LI, North Andover, MA (US);
Kevin Flanagan, Lawrence, MA (US);
Timothy Smith, Lawrence, MA (US);
Inventors:
Leo L. Chan, North Andover, MA (US);
Jean Qiu, North Andover, MA (US);
Peter Li, North Andover, MA (US);
Kevin Flanagan, Lawrence, MA (US);
Timothy Smith, Lawrence, MA (US);
Assignee:
Nexcelom Bioscience LLC, Lawrence, MA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06F 19/26 (2011.01); G01N 21/64 (2006.01);
U.S. Cl.
CPC ...
G06F 19/26 (2013.01); G01N 21/6428 (2013.01); G01N 21/6456 (2013.01); G01N 21/6486 (2013.01);
Abstract
The invention generally relates to analytical and monitoring systems useful for analyzing and measuring cells and biological samples. More particularly, the invention provides systems and methods for internal calibration and focus reference for cytometry imaging.