The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 07, 2015
Filed:
Jan. 16, 2014
Applicant:
Lsi Corporation, San Jose, CA (US);
Inventor:
Ashish Batwara, Wichita, KS (US);
Assignee:
AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD., Singapore, SG;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/07 (2006.01); G06F 11/16 (2006.01); G06F 11/20 (2006.01);
U.S. Cl.
CPC ...
G06F 11/073 (2013.01); G06F 11/167 (2013.01); G06F 11/2089 (2013.01); G06F 2201/83 (2013.01); G06F 11/1658 (2013.01);
Abstract
Disclosed is a method of detecting a product data error in a storage system. First and second vital product data (VPD) EEPROMs are read. Indicators of whether wither or both reads failed are received. Based on these indicators, the contents of the VPD EEPROMs may be compared. Based on a result of the comparing indicating a match, an arbitrary one of the VPD EEPROMS is used. Based on an indicator indicating an error with the first VPD EEPROM, the second VPD EEPROM is used.