The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 07, 2015
Filed:
Feb. 11, 2013
Texas Instruments Incorporated, Dallas, TX (US);
Michael Douglas Snedeker, Tucson, AZ (US);
TEXAS INSTRUMENTS INCORPORATED, Dallas, TX (US);
Abstract
Apparatus and methods process a set of calibration sample values acquired in response to a sequence of calibration touch events generated at known X-Y coordinate positions along a linear path across a touch panel surface. The set of calibration sample values is then curve-fitted to the path to create a characteristic model of the touch panel or a portion thereof. Run-time signals are acquired from X-Y nodes across the panel at the time of a touch event. One or more run-time signal values may be substituted into the panel characteristic model to determine a distance between an X-Y node most strongly associated with the run-time touch event and a point-of-projection of the touch event location onto the path.