The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 07, 2015
Filed:
Apr. 24, 2012
Andreas Masselli, Tuebingen, DE;
Karl Engelbert Wenzel, Dettenhausen, DE;
Andreas Zell, Wannweil, DE;
Andreas Masselli, Tuebingen, DE;
Karl Engelbert Wenzel, Dettenhausen, DE;
Andreas Zell, Wannweil, DE;
Eberhard Karls Universitaet Tuebingen, Tuebingen, DE;
Abstract
A method for determining the relative position of an object in an area in six spatial degrees of freedom is provided. A marker pattern with at least three markers is applied on the object, and an optical detecting device is provided with a two-dimensional sensor surface. The object is moved in the detection region of the optical detecting device such that the marker pattern can be detected by the detecting device, images of the markers are projected onto image positions on the sensor surface, and the image coordinates of the markers are ascertained. The relative position of the marker pattern is determined by analyzing the image coordinates. The position of an invariant point is ascertained on a reference circle on a reference plane, and describes a unique relationship between a coordinate system assigned to the marker pattern and a coordinate system assigned to the detecting device.