The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 07, 2015
Filed:
Jul. 20, 2010
Maya Aviv, Ness Ziona, IL;
Gennady Meltser, Kiryat-Gat, IL;
Yuri Sapozhnikov, Ness Ziona, IL;
Shai Druckman, Ness Ziona, IL;
Maya Aviv, Ness Ziona, IL;
Gennady Meltser, Kiryat-Gat, IL;
Yuri Sapozhnikov, Ness Ziona, IL;
Shai Druckman, Ness Ziona, IL;
Hewlett-Packard Indigo B.V., Maastricht, NL;
Abstract
A method and apparatus are provided for assessing the operation of a col or printing system () by measuring color plane mis-registration. The printing system () is caused to print a multi-sheet test job () with corresponding test points on each sheet distributed vertically and horizontally over the sheet. The test points comprise test markings for determining horizontal and vertical color plane mis-registration values. These test markings are measured by an imaging subsystem () to determine horizontal and vertical color plane mis-registration values () for the printing colors. The mis-registration values are then analyzed () by a processing subsystem () to derive a plurality of mis-registration parameters that provide different respective views of mis-registration behaviour across the test sheets. An output is provided based on the mis-registration parameters.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile