The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 07, 2015

Filed:

Aug. 14, 2012
Applicant:

Woo Jun Kim, Gyeonggi-do, KR;

Inventor:

Woo Jun Kim, Gyeonggi-do, KR;

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/06 (2006.01); G02B 21/22 (2006.01); G02B 17/02 (2006.01); G02B 26/08 (2006.01);
U.S. Cl.
CPC ...
G02B 21/22 (2013.01); G02B 17/023 (2013.01); G02B 26/0883 (2013.01);
Abstract

An optical system is used in a microscope which is provided to observe a sample or in a light emitting device which applies a beam of light such as a laser beam onto a sample. The optical system can form an oblique path of light so that without shifting the sample or the position of the eyes of the observer (or the position of a light source of the light emitting device), the observer can observe (in the case of the light emitting device, it can apply light onto) not only a vertical top side the sample but also a front, rear, left or right side of the sample, or the position of a portion of the sample to be observed (in the case of the light emitting device, a portion onto which light is applied) can be varied.


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