The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 07, 2015
Filed:
Mar. 29, 2012
Applicants:
Jeffrey B. Barber, Vineland, NJ (US);
James C. Weatherall, Linwood, NJ (US);
Inventors:
Jeffrey B. Barber, Vineland, NJ (US);
James C. Weatherall, Linwood, NJ (US);
Assignee:
Battelle Memorial Institute, Columbus, OH (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S 7/497 (2006.01); G01S 7/40 (2006.01); G01S 7/41 (2006.01); G01S 13/88 (2006.01);
U.S. Cl.
CPC ...
G01S 7/497 (2013.01); G01S 7/40 (2013.01); G01S 7/4052 (2013.01); G01S 7/411 (2013.01); G01S 13/887 (2013.01); G01S 2007/4082 (2013.01);
Abstract
A contrast phantom for an active millimeter wave imaging system is made from different materials or sections having different reflectivities. The reflectivities incrementally increase in discrete steps so that the phantom is useable to calibrate the active millimeter wave imaging system. The reflectivities preferably range from 0% to 100% and incrementally and linearly increase in equal steps. A method of producing the contrast phantom for the active millimeter wave imaging system is also described.