The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 07, 2015

Filed:

Jul. 30, 2009
Applicants:

Kerry Bernstein, Underhill, VT (US);

James Culp, Newburgh, NY (US);

David F. Heidel, Mahopac, NY (US);

Dirk Pfeiffer, Croton-on-Hudson, NY (US);

Anthony D. Polson, Jericho, VT (US);

Peilin Song, Lagrangeville, NY (US);

Franco Stellari, Waldwick, NJ (US);

Robert L. Wisnieff, Ridgefield, CT (US);

Inventors:

Kerry Bernstein, Underhill, VT (US);

James Culp, Newburgh, NY (US);

David F. Heidel, Mahopac, NY (US);

Dirk Pfeiffer, Croton-on-Hudson, NY (US);

Anthony D. Polson, Jericho, VT (US);

Peilin Song, Lagrangeville, NY (US);

Franco Stellari, Waldwick, NJ (US);

Robert L. Wisnieff, Ridgefield, CT (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G01R 31/311 (2006.01); G01R 31/00 (2006.01);
U.S. Cl.
CPC ...
G01R 31/311 (2013.01);
Abstract

An emission map of a circuit to be tested for alterations is obtained by measuring the physical circuit to be tested. An emission map of a reference circuit is obtained by measuring a physical reference circuit or by simulating the emissions expected from the reference circuit. The emission map of the circuit to be tested is compared with the emission map of the reference circuit, to determine presence of alterations in the circuit to be tested, as compared to the reference circuit.


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