The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 07, 2015
Filed:
Mar. 06, 2014
Applicant:
Murata Manufacturing Co., Ltd., Nagaokakyo-Shi, Kyoto-fu, JP;
Inventors:
Takashi Kondo, Nagaokakyo, JP;
Seiji Kamba, Nagaokakyo, JP;
Assignee:
MURATA MANUFACTRURING CO., LTD., Nagaokakyo-Shi, Kyoto-Fu, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 5/02 (2006.01); G01N 21/51 (2006.01); G01N 21/25 (2006.01); G01N 21/3586 (2014.01); G01N 21/03 (2006.01); B01L 3/00 (2006.01); G01N 21/3577 (2014.01); G01N 21/35 (2014.01);
U.S. Cl.
CPC ...
G01N 21/51 (2013.01); G01N 21/253 (2013.01); G01N 21/3586 (2013.01); G01N 21/03 (2013.01); G01N 2021/0346 (2013.01); G01N 21/3577 (2013.01); B01L 3/50255 (2013.01); G01N 2021/3595 (2013.01); B01L 2300/0618 (2013.01);
Abstract
A measurement device that includes a device main unit including at least one cavity for accommodating an analyte containing a specimen and an aperture array structure including a plurality of apertures extending therethrough in a direction perpendicular to a principal surface thereof. The aperture array structure is fixed such that part or all of the aperture array structure is positioned in the cavity.