The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 07, 2015

Filed:

Jun. 25, 2012
Applicants:

Frederik Leyns, Oosterzele, BE;

Cádrick Vandaele, Wortegem-Petegem, BE;

Pierre Lejeune, Tilff, BE;

Jeroen Baert, Erpe-Mere, BE;

Fabio Fiorani, Jülich, DE;

Inventors:

Frederik Leyns, Oosterzele, BE;

Cádrick Vandaele, Wortegem-Petegem, BE;

Pierre Lejeune, Tilff, BE;

Jeroen Baert, Erpe-Mere, BE;

Fabio Fiorani, Jülich, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/17 (2006.01); A01G 7/00 (2006.01); G01N 21/84 (2006.01);
U.S. Cl.
CPC ...
G01N 21/17 (2013.01); A01G 7/00 (2013.01); G01N 21/84 (2013.01);
Abstract

A screening device () for screening at least one plant specimen () in a plurality of plant specimens () is disclosed. The screening device () comprises a detector () adapted for acquiring spatially resolved images (). The screening device () further comprises at least one selection device () adapted for selecting a single plant specimen () or a group of plant specimens () from the plurality of plant specimens () for imaging by the detector (). The selection device () comprises a deflection device () adapted for deflecting electromagnetic waves propagating between the plant specimens () and the detector ().


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