The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 07, 2015
Filed:
Oct. 21, 2011
Tae-hyun Yoon, Seoul, KR;
Song-hee Lee, Seoul, KR;
Dong-wook Kwon, Seoul, KR;
Jong-hoon Park, Seoul, KR;
Hyun-ju Yoo, Seoul, KR;
Hyun-woo Nho, Seoul, KR;
Tae-Hyun Yoon, Seoul, KR;
Song-Hee Lee, Seoul, KR;
Dong-Wook Kwon, Seoul, KR;
Jong-Hoon Park, Seoul, KR;
Hyun-Ju Yoo, Seoul, KR;
Hyun-Woo Nho, Seoul, KR;
Abstract
The present invention relates to a method for the toxicity assessment of nano-materials, and more specifically, it is relates to an objective, reproducible and accurate assessment method for the unbiased toxicity testings of nano-materials, which minimize artifacts of the conventional methods for the toxicity assessment of the nano-materials by considering the dose characteristics of the nano-material itself using Selective multi-Plane Illumination Microcopy (SPIM); and the response characteristics of the nano-material using the improved or novel cellular responses assessment methods for nano-materials (e.g., modified MTT assay using image cytometric analysis, normal-inverted exposure apparatus, and modified flow cytometry), and a system and an apparatus thereof.