The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 07, 2015
Filed:
Aug. 06, 2010
Kenji Hasegawa, Tokyo, JP;
Nobuhisa Ito, Tokyo, JP;
Kenji Hasegawa, Tokyo, JP;
Nobuhisa Ito, Tokyo, JP;
YKK Corporation, , JP;
Abstract
A cloth evaluation apparatus can grasp the piercing property and the cutting property with a cloth in advance. The cloth evaluation apparatus includes a measuring member having, on its distal side, a measuring part to pass through a cloth; a cloth/measuring part moving means for moving the cloth or the measuring member so that the measuring part passes through the cloth; a cloth supporting means for supporting the cloth at around a passing-through point, in the cloth, of the measuring part from both sides of the cloth when the measuring part passes through the cloth; and a load detecting means for detecting a load being applied to the measuring member while the measuring part passes through the cloth.