The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 07, 2015

Filed:

Oct. 26, 2011
Applicant:

Shunsuke Ariyoshi, Kobe, JP;

Inventor:

Shunsuke Ariyoshi, Kobe, JP;

Assignee:

SYSMEX CORPORATION, Hyogo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 1/31 (2006.01); G01N 35/00 (2006.01); G01N 35/02 (2006.01);
U.S. Cl.
CPC ...
G01N 1/312 (2013.01); G01N 35/00722 (2013.01); G01N 35/026 (2013.01); G01N 2035/0091 (2013.01);
Abstract

A sample processing apparatus includes: a first sample processing unit; a second sample processing unit; and a data processing unit connected to the first and the second sample processing units. The data processing unit includes: a display device; an input device; and a controller configured to show a screen image on the display device, wherein the screen image comprises a shared region which is shared for displaying information of each of the first and the second sample processing units, a first operation section operable by a user to control the first sample processing unit and a second operation section operable by the user to control the second sample processing unit, and control the first sample processing unit in response to an operation of the first operation section, and control the second sample processing unit in response to an operation of the second operation section.


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