The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 07, 2015
Filed:
Jan. 30, 2013
Hewlett-packard Development Company, L.p., Houston, TX (US);
Huei Pei Kuo, Cupertino, CA (US);
Zhiyong Li, Foster City, CA (US);
Shih-Yuan Wang, Palo Alto, CA (US);
Steven J. Barcelo, Palo Alto, CA (US);
Ansoon Kim, Mountain View, CA (US);
Gary Gibson, Palo Alto, CA (US);
Alexandre M Bratkovski, Mountain View, CA (US);
Hewlett-Packard Development Company, L.P., Houston, TX (US);
Abstract
According to an example, apparatuses for performing multiple concurrent spectral analyzes on a sample under test include an optical system to concurrently direct a plurality of light beams onto analytes at multiple locations on the sample under test, in which the plurality of light beams cause light in either or both of a Raman spectra and a non-Raman spectra to be emitted from the analytes at the multiple locations of the sample under test. The apparatuses also include a detector to concurrently acquire a plurality of spectral measurements of the light emitted from the analytes at the multiple locations of the sample under test. Example methods of performing spectral analysis include use of the apparatuses.