The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 07, 2015

Filed:

Mar. 20, 2014
Applicant:

Sick Ag, Waldkirch, DE;

Inventors:

Jurgen Kaufmann, Waldkirch, DE;

Thomas Beyer, Waldkirch, DE;

Julian Edler, Waldkirch, DE;

Assignee:

Sick AG, Waldkirch, DE;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/10 (2006.01); G01J 1/42 (2006.01); G01J 3/42 (2006.01); G01J 3/02 (2006.01);
U.S. Cl.
CPC ...
G01J 3/108 (2013.01); G01J 1/4257 (2013.01); G01J 3/42 (2013.01); G01J 3/0229 (2013.01);
Abstract

A spectrometer has a first and second light sources () which generate light radiation () in a first and second wavelength ranges, and a mirror unit () for deflecting the light radiation () into a measurement path (), arranged so that the radiation of both wavelength ranges () runs through on the same optical path. A detector () detects radiation () running through the measurement path () and an evaluation unit () evaluates the radiation () incident at the detector () and for determining a concentration of a measurement gas component present in the measurement path (). The mirror unit () is configured as a micromirror array () and that a single micromirror () only deflects a portion of the radiation ().


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