The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 07, 2015
Filed:
Feb. 22, 2013
Canon Kabushiki Kaisha, Tokyo, JP;
Tatsuya Suzuki, Tokyo, JP;
Tetsuri Sonoda, Yokohama, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
A projection pattern that includes a measurement pattern for measuring a distance to a target object, and a code pattern for identifying the measurement pattern is projected onto the target object. The target object onto which the projection pattern was projected is sensed. On the basis of a relationship between the measurement pattern and the code pattern in the sensed image, the projection pattern that is to be projected onto the target object after the projection pattern are changed, the code pattern is read out in the sensed image of the target object onto which the changed projection pattern was projected, and the measurement pattern is associated with it. Using the associated measurement pattern, a distance from the projection unit or the sensing unit to the target object is acquired.