The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 07, 2015
Filed:
May. 19, 2009
Ulrich Marzok, Berlin, DE;
Ralf Müller, Berlin, DE;
Reinhard Schadrack, Berlin, DE;
Michael Krauhausen, Aachen, DE;
Ulrich Marzok, Berlin, DE;
Ralf Müller, Berlin, DE;
Reinhard Schadrack, Berlin, DE;
Michael Krauhausen, Aachen, DE;
BAM Bundesanstalt Fuer Materialforschung und- Pruefung, Berlin, DE;
Nokra Optische Prueftechnik und Automation GmbH, Baesweiler, DE;
Abstract
The invention relates to a method and a device for sintering objects by means of time-resolved detection of two- or three-dimensional surface profiles and, optionally, by means of temperature measurement in a high temperature furnace on the basis of optical measurement methods. During sintering, each surface point on an object can be measured for its position and, optionally, its temperature, and a change can be determined by successive measurements. The measured change additionally permits control of the sintering regime. The method comprises the steps of: placing an objectinto a high temperature furnace; heating the furnace; generating a two- or three-dimensional surface profile at least of a subregion of the objectby: irradiating the objectwith light from a light source; detecting the light scattered by the objectwith the aid of a detector; determining the geometric surface profile from the detected light.