The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 07, 2015
Filed:
May. 13, 2013
General Electric Company, Schenectady, NY (US);
Clark Alexander Bendall, Syracuse, NY (US);
Joshua Lynn Scott, Jordan, NY (US);
General Electric Company, Schenectady, NY (US);
Abstract
Measurement accuracy of a remote visual inspection (RVI) system is tested using a test object including a test feature having a known geometric characteristic. Using a controller, attachment of a detachable measurement optical tip to an RVI probe is detected. A user is then prompted to perform testing of the measurement accuracy. When the user indicates the test feature is visible, the system captures one or more images of the test feature, determines coordinates of the test feature from the images, and measures a geometric characteristic of the test feature using the coordinates. An accuracy result is determined using the measured geometric characteristic and the known geometric characteristic, and an indication is provided, e.g., to the user, of the result of the comparison. An RVI system with a user-prompt device is also described.