The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 07, 2015

Filed:

Dec. 03, 2013
Applicant:

Orbital Atk, Inc., Dulles, VA (US);

Inventors:

Edward C. Mathias, North Logan, UT (US);

John L. Shipley, Tremonton, UT (US);

Assignee:

ALLIANT TECHSYSTEMS INC., Arlington, VA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01L 3/20 (2006.01); G01L 3/00 (2006.01); G01L 1/00 (2006.01); G01M 5/00 (2006.01); G01B 5/20 (2006.01); G01B 7/16 (2006.01); A63F 13/20 (2014.01); F02K 9/34 (2006.01);
U.S. Cl.
CPC ...
G01B 5/20 (2013.01); G01B 7/16 (2013.01); A63F 13/06 (2013.01); F02K 9/346 (2013.01);
Abstract

Methods, devices, and systems relating to a sensing device are disclosed. A device may comprise a structure including a first surface and a second, opposite surface, wherein the structure comprises one or more segments. Further, the device may include a plurality of sensors disposed on the structure, wherein each segment of the one or more segments comprises a first sensor of the plurality of sensors coupled to the first surface and an associated second sensor of the plurality of sensors coupled to the second surface. Moreover, each sensor of the plurality of sensors may be configured to measure a strain exhibited on an adjacent surface of the structure at an associated segment of the one or more segments.


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