The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 07, 2015
Filed:
Dec. 03, 2012
Grintech Gmbh, Jena, DE;
Bernhard Messerschmidt, Jena, DE;
GRINTECH GmbH, Jena, DE;
Abstract
An optically corrective microprobe for white light interferometry is disclosed. In white light interferometry which uses different spectral ranges, the dispersion-induced dependency of optical path differences on the wavelength between measurement light bundle and reference light bundle is compensated by an efficient, easily miniaturized arrangement. A reference beamsplitter with partially reflecting filters in at least two different spectral ranges for generating at least two transmitted measurement light bundles and associated reflected reference light bundles of nonoverlapping spectral ranges is arranged between the light output surface of the light-conducting fiber and the focusing optics. An axial distance between two partially reflecting filters is adjusted in such a way that a spectrally induced optical path difference to which the respective measurement light bundles are subjected when passing through dispersive elements in the light path to the object surface and back is present to the same magnitude between the respective reference light bundles.