The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 07, 2015

Filed:

Mar. 28, 2007
Applicants:

Yukihiro Takahashi, Tokyo, JP;

Terufumi Hamamoto, Akishima, JP;

Kenichi Shinde, Hussa, JP;

Inventors:

Yukihiro Takahashi, Tokyo, JP;

Terufumi Hamamoto, Akishima, JP;

Kenichi Shinde, Hussa, JP;

Assignee:

HOYA CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C23C 14/54 (2006.01); C23C 14/22 (2006.01); C23C 14/32 (2006.01); C23C 14/06 (2006.01); C23C 16/02 (2006.01); H01J 27/02 (2006.01); G02B 1/11 (2006.01); C23C 14/56 (2006.01); C23C 14/00 (2006.01); C23C 16/30 (2006.01); H01J 37/302 (2006.01); H01J 37/08 (2006.01); H01J 37/317 (2006.01);
U.S. Cl.
CPC ...
C23C 14/32 (2013.01); G02B 1/11 (2013.01); C23C 14/54 (2013.01); H01J 2237/022 (2013.01); C23C 14/564 (2013.01); C23C 14/0042 (2013.01); C23C 16/30 (2013.01); H01J 27/02 (2013.01); C23C 14/221 (2013.01); H01J 37/08 (2013.01); H01J 37/317 (2013.01); C23C 14/0031 (2013.01); H01J 37/302 (2013.01); H01J 37/3178 (2013.01); H01J 2237/006 (2013.01);
Abstract

An ion gun system includes an ion gun for irradiating an ion beam; an electric power supply unit for supplying electric power to the ion gun; two mass flow regulators for introducing each of two types of gas in the ion gun; a control unit connected to the electric power supply unit for working as ion gun control means for controlling electric power supplied to the ion gun from the electric power supply unit; and a control unit connected to the mass flow regulators for working as mass flow control means for controlling the flow rate of gas introduced from the mass flow regulators in the ion gun. The control unit as mass flow control means is provided with a function of changing the set value for the flow rate of each of the two types of gas to another set value by changing it stepwise within a range where the ion gun is working stably. Accordingly, shortening of film formation time can be attained.


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