The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 07, 2015

Filed:

Feb. 01, 2013
Applicants:

International Business Machines Corporation, Armonk, NY (US);

University of Central Florida Research Foundation, Inc., Orlando, FL (US);

Inventors:

Ravishankar Rao, Elmsford, NY (US);

Soumyabrata Dey, Orlando, FL (US);

Mubarak Shah, Oviedo, FL (US);

Solmaz Berkan, Oviedo, FL (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); A61B 5/00 (2006.01); G06T 7/00 (2006.01); G06K 9/46 (2006.01); A61B 5/055 (2006.01); A61B 5/16 (2006.01);
U.S. Cl.
CPC ...
A61B 5/7264 (2013.01); A61B 5/055 (2013.01); A61B 5/7225 (2013.01); A61B 5/7246 (2013.01); A61B 5/0042 (2013.01); A61B 5/168 (2013.01); G06T 7/0012 (2013.01); G06T 2207/10076 (2013.01); G06T 2207/10088 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/30016 (2013.01); G06K 9/4676 (2013.01);
Abstract

Systems and methods for processing image data are provided. A computer implemented method for processing image data, comprises gathering 4-D image data from a subject, extracting time series data, and spatial and degree data of each voxel of the subject, deriving at least one feature from the time series data, deriving at least one feature from the spatial and degree data, combining the at least one feature from the time series data, and the at least one feature from the spatial and degree data to generate combined data, and inputting the combined data to a classifier, wherein the classifier outputs a classification based on the combined data.


Find Patent Forward Citations

Loading…