The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 30, 2015
Filed:
Jun. 16, 2014
Applicant:
Amazon Technologies, Inc., Reno, NV (US);
Inventors:
Omair Abdul Rahman, San Jose, CA (US);
Ted John Cooper, Sunnyvale, CA (US);
Assignee:
Amazon Technologies, Inc., Reno, NV (US);
Primary Examiner:
Int. Cl.
CPC ...
G03B 15/03 (2006.01); H04N 5/225 (2006.01); H04N 5/378 (2011.01);
U.S. Cl.
CPC ...
H04N 5/2256 (2013.01); H04N 5/378 (2013.01);
Abstract
Techniques for calibrating spatial uniformity of light emitted by a light source include receiving light from a unit under test with an array of photo detectors. Sampling circuitry receives an output signal generated by each of the photo detectors in response to the received light, and samples each of the output signals to generate a sampled output signal for each of the photo detectors. One or more processors determine a spatial uniformity measure of one or both of luminous intensity and chromaticity for the received light using the sampled output signals.