The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 30, 2015
Filed:
Jul. 29, 2011
Applicants:
Eva Rifkah, Montreal, CA;
Aishy Amer, St-Laurent, CA;
Inventors:
Eva Rifkah, Montreal, CA;
Aishy Amer, St-Laurent, CA;
Assignee:
VALORBEC, SOCIETE EN COMMANDITE, Montreal, Quebec, CA;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/40 (2006.01); H04N 5/21 (2006.01); G06T 5/00 (2006.01);
U.S. Cl.
CPC ...
H04N 5/21 (2013.01); G06T 5/002 (2013.01); G06T 2207/10016 (2013.01); G06T 2207/20012 (2013.01); G06T 2207/20192 (2013.01);
Abstract
There is described a Minimal Iterativity Anisotropic Diffusion (MIAD) approach that estimates the required number of iterations N as a function of the image structure-under-noise ρ and the bound of the noise η. The time step λ is related to the image structure-under-noise ρ and to the bound of noise λ. The stopping time is calculated using T=λ·N, and the edge strength σ is determined as a function of T, η, and ρ.