The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 30, 2015

Filed:

Nov. 09, 2010
Applicant:

Shigeto Tamezane, Kakogawa, JP;

Inventor:

Shigeto Tamezane, Kakogawa, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H02J 7/00 (2006.01); H02J 7/14 (2006.01); B60L 11/18 (2006.01); B60L 15/20 (2006.01); H01M 10/48 (2006.01); G01R 31/36 (2006.01); H01M 10/0525 (2010.01);
U.S. Cl.
CPC ...
H02J 7/0077 (2013.01); B60L 11/1838 (2013.01); B60L 11/1857 (2013.01); B60L 11/1859 (2013.01); B60L 11/1861 (2013.01); B60L 15/2045 (2013.01); B60L 2240/545 (2013.01); B60L 2240/549 (2013.01); G01R 31/3624 (2013.01); G01R 31/3662 (2013.01); H01M 10/0525 (2013.01); H01M 10/48 (2013.01); H01M 10/486 (2013.01); H01M 2220/20 (2013.01); Y02T 10/7005 (2013.01); Y02T 10/7011 (2013.01); Y02T 10/7044 (2013.01); Y02T 10/705 (2013.01); Y02T 10/7283 (2013.01); Y02T 90/121 (2013.01); Y02T 90/128 (2013.01); Y02T 90/14 (2013.01); Y02T 90/163 (2013.01);
Abstract

A method includes steps of dividing resistance R into a physical and chemical resistances Rand R, obtaining corrected open-circuit voltages Vcorresponding to setting currents Ito I, acquiring predicted reaching voltages Vto Vcorresponding to the setting currents Ito I, and creating a current-voltage curve. The corrected open-circuit voltages Vare obtained to predict available maximum currents Iin a particular time t. The predicted reaching voltages Vto Vare acquired based on corrected physical and chemical resistances Rand R, and the corrected open-circuit voltages V. The current-voltage curve is creased based on the setting currents Ito Iand the predicted reaching voltages Vto Vto acquire upper and lower limit voltages Vand V, and upper and lower limit currents Iand Iat a temperature whereby assigning these limit currents to available maximum currents Iin charging and discharging operations, respectively.


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