The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 30, 2015

Filed:

Apr. 08, 2013
Applicant:

Implant Sciences Corporation, Wilmington, MA (US);

Inventors:

Dmitriy V. Ivashin, Peabody, MA (US);

Said Boumsellek, San Diego, CA (US);

Assignee:

Implant Sciences Corporation, Wilmington, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 49/10 (2006.01); G01N 27/64 (2006.01); G01N 27/62 (2006.01); H01J 49/14 (2006.01);
U.S. Cl.
CPC ...
H01J 49/105 (2013.01); H01J 49/145 (2013.01); G01N 27/64 (2013.01); G01N 27/624 (2013.01);
Abstract

Selective ionization at atmospheric or near atmospheric pressure of a sample diluted in air is provided in multiple steps. Initially, components of air and/or other gas are ionized to generate reactive ions. The reactive ions are then filtered using a high frequency filter to yield selected reactive ions. Thereafter, the selected reactive ions are reacted with sample molecules of a sample being analyzed in a charge transfer process. Depending on the properties of the sample molecules, the filter may select some reactive ions to enter the sample zone and block others entirely thus controlling ion chemistry and charge transfer yields in the sample zone. The described system is directed to controlling ions at the ion source level, using a high frequency filter technique, in connection with subsequent analysis. The method generates the ions of choice for subsequent analysis in such platforms as ion mobility and differential mobility spectrometers.


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