The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 30, 2015

Filed:

Oct. 10, 2012
Applicant:

Hgst Netherlands B.v., Amsterdam, NL;

Inventors:

Robert Eugeniu Mateescu, San Jose, CA (US);

Luiz Franca-Neto, Sunnyvale, CA (US);

Cyril Guyot, San Jose, CA (US);

Hessam Mahdavifar, San Diego, CA (US);

Zvonimir Bandic, San Jose, CA (US);

Qingbo Wang, Irvine, CA (US);

Assignee:

HGST Netherlands B.V., Amsterdam, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/10 (2006.01); G11C 29/00 (2006.01); G06F 11/00 (2006.01); G11C 29/52 (2006.01); G11C 29/04 (2006.01);
U.S. Cl.
CPC ...
G11C 29/802 (2013.01); G11C 29/52 (2013.01); G11C 2029/0411 (2013.01); G06F 11/1048 (2013.01);
Abstract

A data storage system has a memory circuit that comprises memory cells and a control circuit that receives data bits provided for storage in the memory cells. The control circuit encodes the data bits to generate a first set of redundant bits and encoded data bits, such that the encoded data bits selected for storage in a first subset of the memory cells with first stuck-at faults have digital values of corresponding ones of the first stuck-at faults. The control circuit encodes the first set of redundant bits to generate a second set of redundant bits. The control circuit performs logic functions on the second set of redundant bits and the encoded data bits to generate a third set of redundant bits, such that redundant bits in the third set of redundant bits selected for storage in a second subset of the memory cells with second stuck-at faults have digital values of corresponding ones of the second stuck-at faults.


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