The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 30, 2015

Filed:

Feb. 27, 2013
Applicant:

Tata Consultancy Services Limited, Maharashtra, IN;

Inventors:
Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 11/20 (2006.01); G06K 9/00 (2006.01); G06K 9/62 (2006.01); G06F 19/26 (2011.01); G06F 19/24 (2011.01);
U.S. Cl.
CPC ...
G06T 11/206 (2013.01); G06K 9/0014 (2013.01); G06K 9/6222 (2013.01); G06F 19/26 (2013.01); G06F 19/24 (2013.01);
Abstract

Method(s) and system(s) for identifying marker features of various subsets of a multi-dimensional data are provided. Each subset includes various data points associated with various features. Each of the data points are defined by feature values corresponding to the associated features. The method includes identifying feature pairs based on a matrix of the data points and the features, and computing correlation distances between features in each of the feature pairs. The method includes generating a non-linear pattern of the plurality of features in a two-dimensional plane. Additionally, the method includes calculating a threshold feature value for the associated features of the data points of a particular subset and representing the threshold feature value as a threshold non-linear pattern in the two-dimensional plane. The method includes determining the marker features based on a relative position of the features with respect to the threshold feature value in the two-dimensional plane.


Find Patent Forward Citations

Mande, Sharmila. (2015). Identification of marker features in multi-dimensional data (U.S. Patent No. 9070226). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9070226

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